This inventor holds 1 USPTO granted patent. Top assignees: Elwave, Institut Mines-Telecom. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2025
Title: Quentin Vincent Delplanque: Innovator in Detection Methods
Introduction
Quentin Vincent Delplanque is a notable inventor based in Nantes, France. He has made significant contributions to the field of detection methods, particularly in electrically conductive mediums. His innovative approach has led to the development of a unique patent that enhances the ability to locate or identify objects within such environments.
Latest Patents
Delplanque holds a patent for a "Method of detection in an electrically conductive medium." This method utilizes a detection system comprising multiple electrodes that can be configured in various states, including transmitting, receiving, and disconnected. The system determines its operating point based on a priori setpoints or previous configurations, allowing for precise measurements and enhanced detection capabilities.
Career Highlights
Throughout his career, Delplanque has worked with reputable organizations such as Elwave and Institut Mines-Telecom. His experience in these institutions has contributed to his expertise in developing advanced detection technologies. His work has been instrumental in pushing the boundaries of what is possible in the field of electrical detection.
Collaborations
Delplanque has collaborated with several professionals in his field, including Vincent Paul Yannick Lebastard and Lyes Ifrek. These collaborations have fostered a creative environment that has led to innovative solutions and advancements in detection methods.
Conclusion
Quentin Vincent Delplanque is a distinguished inventor whose work in detection methods has made a significant impact in the field. His patent and collaborations reflect his commitment to innovation and excellence. His contributions continue to influence advancements in technology and detection systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile