This inventor holds 1 USPTO granted patent. Top assignee: Hefei University of Technology. Active years: 2022.
Company Filing History:
Years Active: 2022
Title: Innovations in Analog-Circuit Fault Diagnosis by Qiwu Luo
Introduction
Qiwu Luo is a prominent inventor based in Anhui, China. He has made significant contributions to the field of analog-circuit fault diagnosis. His innovative methods leverage advanced techniques to enhance the accuracy and efficiency of fault classification in electronic circuits.
Latest Patents
Qiwu Luo holds a patent for an "Analog-circuit fault diagnosis method based on continuous wavelet analysis and ELM neural network." This method involves several key steps: data acquisition, feature extraction, and fault classification. The process begins with data sampling of output responses from an analog circuit using Multisim simulation. This generates an output response data set. The next step is feature extraction, where continuous wavelet analysis is performed on the data set to create a wavelet time-frequency coefficient matrix. This matrix is divided into eight sub-matrices, and singular value decomposition is applied to calculate Tsallis entropy for each sub-matrix, forming feature vectors for corresponding faults. Finally, these feature vectors are submitted to the ELM network for accurate and quick fault classification. This method significantly improves the extraction of circuit fault features and enables efficient fault classification.
Career Highlights
Qiwu Luo is affiliated with Hefei University of Technology, where he continues to advance research in circuit diagnostics. His work has garnered attention for its practical applications in improving electronic circuit reliability.
Collaborations
Qiwu Luo has collaborated with notable colleagues, including Yigang He and Wei He. Their joint efforts contribute to the ongoing development of innovative solutions in the field of circuit diagnostics.
Conclusion
Qiwu Luo's contributions to analog-circuit fault diagnosis exemplify the impact of innovative thinking in engineering. His patented methods enhance the accuracy and efficiency of fault classification, showcasing the importance of research and collaboration in technological advancements.