Shanghai, China

Qiujing Xiang

This inventor holds 2 USPTO granted patents and 2 published patent applications and 1 EPO patent. Top assignee: Shanghai United Imaging Healthcare Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qiujing Xiang. Retrieved from https://idiyas.com/inventor/qiujing-xiang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Innovations by Qiujing Xiang in Healthcare Technology

Introduction

Qiujing Xiang is a notable inventor based in Shanghai, China. He has made significant contributions to the field of healthcare technology, particularly in the area of scanning parameter determination. His work focuses on improving the efficiency and accuracy of clinical assessments through innovative systems and methods.

Latest Patents

Qiujing Xiang holds 1 patent for his invention titled "Systems, devices, and methods for scanning parameter determination." This patent outlines a system that provides a user interface for inputting clinical information related to a target subject. The system utilizes a trained machine learning model to determine recommended values of scanning parameters based on the input clinical information, which may include symptom details.

Career Highlights

Qiujing Xiang is associated with Shanghai United Imaging Healthcare Ltd., where he applies his expertise in developing advanced healthcare solutions. His work at the company emphasizes the integration of technology and clinical practice to enhance patient care.

Conclusion

Qiujing Xiang's innovative contributions to healthcare technology demonstrate the potential of machine learning in clinical settings. His patent reflects a commitment to improving diagnostic processes and patient outcomes through technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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