Hangzhou, China

Qisen Liang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Zhejiang University. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qisen Liang. Retrieved from https://idiyas.com/inventor/qisen-liang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Qisen Liang: Innovator in Die-Casting Technology

Introduction

Qisen Liang is a prominent inventor based in Hangzhou, China. He has made significant contributions to the field of die-casting technology. His innovative approach has led to the development of a unique testing machine that simulates the die-casting cooling process.

Latest Patents

Qisen Liang holds 1 patent for his invention titled "Testing machine for simulating die-casting die cooling process." This machine includes various components such as a mold base, stationary and moving dies, a guide rod, an ejector rod, and a mold clamping device. The design also features a point cooling device housing, cooling water channels, heating coils, and a control system that enhances the efficiency of the cooling process in die-casting.

Career Highlights

Qisen Liang is affiliated with Zhejiang University, where he continues to advance his research and development in the field of die-casting technology. His work has garnered attention for its practical applications in manufacturing processes.

Collaborations

Qisen Liang has collaborated with notable colleagues, including Zhongbin Xu and Bin Xue. Their combined expertise contributes to the innovative projects at Zhejiang University.

Conclusion

Qisen Liang's contributions to die-casting technology exemplify the impact of innovation in manufacturing. His work not only enhances the efficiency of production processes but also sets a benchmark for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…