This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: United Semiconductor (Xiamen) Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by Qingrong Chen in Wafer Defect Detection
Introduction
Qingrong Chen is a notable inventor based in Xiamen, China. He has made significant contributions to the field of semiconductor technology, particularly in the detection of defects on wafers. His innovative work has led to the development of a patented method that enhances the quality control processes in semiconductor manufacturing.
Latest Patents
Qingrong Chen holds a patent titled "Method for Detecting Defects on Wafers, System for Detecting Defects on Wafers." This patent represents a crucial advancement in the semiconductor industry, providing a reliable approach to identifying defects that can affect the performance of electronic devices.
Career Highlights
Qingrong Chen is currently employed at United Semiconductor (Xiamen) Co., Ltd. His role at the company allows him to apply his expertise in semiconductor technology and contribute to the advancement of innovative solutions in the industry.
Collaborations
Qingrong Chen has collaborated with several talented individuals, including Yu Peng Hong and Chin-Chun Huang. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies in wafer defect detection.
Conclusion
Qingrong Chen's contributions to the field of semiconductor technology, particularly through his patented methods, highlight his role as an influential inventor. His work continues to impact the industry positively, ensuring higher quality standards in semiconductor manufacturing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile