Qihao Zhu

Title: Qihao Zhu - Innovator in Defect Location Technology

Introduction

Qihao Zhu is a prominent inventor based in Beijing, China. He has made significant contributions to the field of software engineering, particularly in defect location methodologies. His innovative approach combines advanced graph neural network techniques with program structure analysis to enhance the accuracy of defect identification.

Latest Patents

Qihao Zhu holds a patent for a "Defect location method and device based on coverage information." This patent outlines a method that characterizes program structure and test case coverage information in a graph format. The process involves generating a node attribute sequence and an adjacency matrix, which are then input into a trained graph neural network model. The model outputs a suspicious degree list for the target program, improving defect location accuracy by preserving coverage information without loss or compression.

Career Highlights

Qihao Zhu is affiliated with Peking University, where he continues to advance his research and development in software defect detection. His work has garnered attention for its innovative use of graph-based information characterization, which integrates both coverage and structural information.

Collaborations

Qihao Zhu collaborates with notable colleagues, including Lu Zhang and Yiling Lou. Their combined expertise contributes to the advancement of research in software engineering and defect location technologies.

Conclusion

Qihao Zhu's contributions to defect location technology exemplify the intersection of innovation and practical application in software engineering. His work not only enhances the accuracy of defect detection but also sets a foundation for future advancements in the field.