Beijing, China

Qifei Li

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Chinese Academy of Sciences. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qifei Li. Retrieved from https://idiyas.com/inventor/qifei-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Qifei Li: Innovator in Automatic Depression Detection

Introduction

Qifei Li is a prominent inventor based in Beijing, China. He has made significant contributions to the field of technology, particularly in the area of mental health detection. His innovative approach combines audio and video analysis to predict depression levels in individuals.

Latest Patents

Qifei Li holds a patent for an "Automatic Depression Detection Method and Device." This patent outlines a comprehensive method that includes inputting audio and video files, conducting segmentation and feature extraction, and utilizing advanced computational techniques to predict depression levels. The method integrates multimodal spatio-temporal representations to enhance accuracy in detecting mental health conditions.

Career Highlights

Qifei Li is affiliated with the Chinese Academy of Sciences, where he continues to advance research in his field. His work has garnered attention for its potential impact on mental health diagnostics and treatment.

Collaborations

He has collaborated with notable colleagues, including Jianhua Tao and Mingyue Niu, contributing to various research projects that aim to improve mental health detection technologies.

Conclusion

Qifei Li's innovative work in automatic depression detection showcases the intersection of technology and mental health. His contributions are paving the way for more effective diagnostic tools in the future.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…