Shenzhen, China

Qianhua Chen

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Zte Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qianhua Chen. Retrieved from https://idiyas.com/inventor/qianhua-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations of Qianhua Chen in Drive Testing Technology

Introduction

Qianhua Chen is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of drive testing technology. His innovative work focuses on improving the efficiency and accuracy of positioning methods used in drive tests.

Latest Patents

Qianhua Chen holds a patent for a "Positioning method and device for drive test." This patent outlines a method that determines fixed parking sampling points of a testing vehicle during drive tests. It also includes the determination of location information based on serving cell identification and route matching. The invention aims to implement efficient and accurate positioning of sampling points in drive test data, thereby reducing implementation costs.

Career Highlights

Qianhua Chen is associated with ZTE Corporation, a leading telecommunications company. His work at ZTE has allowed him to focus on developing advanced technologies that enhance drive testing processes. His innovative contributions have positioned him as a key figure in the field.

Collaborations

Qianhua Chen has collaborated with notable colleagues, including Zhenming Zhu and Yaoting Tan. Their combined expertise has contributed to the advancement of technologies in drive testing.

Conclusion

Qianhua Chen's innovative work in drive testing technology exemplifies the impact of effective positioning methods on telecommunications. His contributions continue to shape the industry and improve testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…