This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Innovations by Qiang Lin in Filament Measurement
Introduction
Qiang Lin is a notable inventor based in Zhejiang, China. He has made significant contributions to the field of optical measurement, particularly in the area of filament diffraction. His innovative approach has led to advancements in measurement accuracy and efficiency.
Latest Patents
Qiang Lin holds a patent titled "Method for measuring the diameter of filament diffraction fringes by calculating the frequency domain." This invention involves a systematic approach to measuring filament diameters through a diffraction optical path measurement system. The method captures diffraction fringe images and determines the optimal fringe range while considering noise from CCD sensitivity differences. By simulating electromagnetic field propagation in Fraunhofer diffraction and applying Fourier transform techniques, the filament diameter can be calculated with remarkable precision, achieving accuracy at the sub-nanometer level.
Career Highlights
Qiang Lin is affiliated with Zhejiang University, where he continues to engage in research and development. His work emphasizes the simplicity of calculations and the minimal dependence on experimental devices, showcasing the advantages of frequency domain measurements.
Collaborations
Qiang Lin has collaborated with notable colleagues, including Yingpeng Zhao and Can Zhang. Their joint efforts contribute to the advancement of optical measurement technologies.
Conclusion
Qiang Lin's innovative methods in measuring filament diameters represent a significant leap in optical measurement technology. His contributions not only enhance measurement accuracy but also demonstrate the potential of frequency domain analysis in practical applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
