GuangZhou, China

Qi Zhou

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Gowin Semiconductor Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qi Zhou. Retrieved from https://idiyas.com/inventor/qi-zhou-w2ysva29

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Qi Zhou

Introduction

Qi Zhou is a notable inventor based in GuangZhou, China. He has made significant contributions to the field of semiconductor technology, particularly in the area of error correction for memory systems. His work is characterized by a focus on enhancing the efficiency of testing methods for advanced electronic components.

Latest Patents

Qi Zhou holds a patent for a "Method and apparatus for testing error correcting code (ECC) function of FPGA on-chip block random access memory (BRAM)." This innovative system and method involve control modules and multiple BRAMs with ECC functions that are sequentially connected to form a ring. The design includes parity bit comparison modules that enhance the testing process by reducing the required test stimuli and interactions with upper computer ports, thereby improving test efficiency.

Career Highlights

Qi Zhou is currently employed at Gowin Semiconductor Corporation, where he applies his expertise in semiconductor technology. His work at the company has positioned him as a key player in the development of advanced testing methodologies for electronic components.

Collaborations

Qi Zhou collaborates with talented coworkers, including Jingxiang Wang and Yue Han, who contribute to the innovative projects at Gowin Semiconductor Corporation.

Conclusion

Qi Zhou's contributions to the field of semiconductor technology, particularly through his patent on ECC testing methods, highlight his role as an influential inventor. His work continues to impact the efficiency of electronic component testing, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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