Xi'an, China

Qi Yan

This inventor holds 1 USPTO granted patent. Top assignee: Huawei Technologies Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qi Yan. Retrieved from https://idiyas.com/inventor/qi-yan-r9fu6rpf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Qi Yan and Radio Channel Multipath Innovation.

Introduction

Qi Yan is an inventor associated with Xi’an, China, and Huawei Technologies Co., Ltd. His patent work includes a method for determining radio channel multipath information using downlink beam measurements.

Latest Patents

The provided information lists one patent for Qi Yan: “Method and Apparatus for Determining Radio Channel Multipath Information and Related Device.” The invention describes how a server uses reference signal received powers from multiple downlink beams, together with grid, serving-cell, and power-angular-spectrum cell identities, to determine the angle and strength of propagation paths. By deriving multipath information from these measurements rather than relying on map and engineering-parameter data, the method aims to improve accuracy. Qi Yan is credited with 1 patent in the supplied data.

Career Highlights

Qi Yan’s listed patent reflects work on wireless communications and radio-channel analysis. The approach focuses on using measured beam signals to characterize propagation paths, which can support more accurate channel information.

Collaborations

The supplied information identifies Huawei Technologies Co., Ltd. as Qi Yan’s company and lists XI Zheng and Yibin Kang as coworkers. The patent description presents a server-based method and apparatus, but does not specify the individual contributions of these coworkers.

Conclusion

Qi Yan’s listed invention advances radio-channel multipath estimation by using downlink beam measurements to determine propagation-path characteristics, with the goal of improving accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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