Qi Xie

Title: Innovations of Qi Xie in Structured-Light Measurement

Introduction

Qi Xie is an accomplished inventor based in Guangdong, China. He has made significant contributions to the field of measurement technology, particularly through his innovative patent in structured-light measurement systems. His work has implications for various applications, enhancing precision in measurement techniques.

Latest Patents

Qi Xie holds a patent for a structured-light based measuring method and system. This method involves a matching process that utilizes the imaging positions of laser points captured by two cameras. The process includes determining the number and low-precision depth of a laser point, followed by acquiring candidate matching points to achieve a precise matching result. The computing process then determines the accurate position of the laser point based on the matching results, utilizing a calibration database to enhance measurement accuracy.

Career Highlights

Qi Xie is currently employed at Shenzhen Taishan Online Technology Co., Ltd. His role at the company allows him to apply his expertise in measurement technology and contribute to the development of innovative solutions in the industry. His patent reflects his commitment to advancing measurement techniques and improving accuracy in various applications.

Collaborations

Qi Xie has collaborated with notable colleagues, including Danwei Shi and Di Wu. These collaborations have likely fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Qi Xie's contributions to structured-light measurement technology exemplify his innovative spirit and dedication to precision. His patent and work at Shenzhen Taishan Online Technology Co., Ltd. highlight the importance of advancements in measurement systems.