The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
May. 07, 2010
Danwei Shi, Guangdong, CN;
Di Wu, Guangdong, CN;
Wenchuang Zhao, Guangdong, CN;
Qi Xie, Guangdong, CN;
Danwei Shi, Guangdong, CN;
Di Wu, Guangdong, CN;
Wenchuang Zhao, Guangdong, CN;
Qi Xie, Guangdong, CN;
SHENZHEN TAISHAN ONLINE TECHNOLOGY CO., LTD, Shenzhen, CN;
Abstract
A structured-light measuring method, includes: matching process, in which the number and the low-precision depth of a laser point are achieved by using the imaging position of the laser point on a first camera () according to a first corresponding relationship in a calibration database, and the imaging position of the laser point on a second camera () is searched according to the number and the low-precision depth of the laser point so as to acquire the candidate matching points, then the matching process is completed according to the imaging position of the first camera () and the candidate matching points of the imaging position of the first camera () on the second camera () so that a matching result is achieved; and computing process, in which the imaging position of the second camera () matching with the imaging position of the first camera () is achieved according to the matching result, and then the precision position of the laser point is determined by a second corresponding relationship in the calibration database. A structured-light measuring system utilizes the above measuring method.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile