Danwei Shi

Title: Danwei Shi: Innovator in Structured-Light Measurement Technologies

Introduction

Danwei Shi is a prominent inventor based in Guangdong, China. He has made significant contributions to the field of measurement technologies, particularly through his innovative patents. With a total of four patents to his name, Shi has established himself as a key figure in the development of structured-light measurement systems.

Latest Patents

One of Danwei Shi's latest patents is a structured-light based measuring method and system. This method includes a matching process that utilizes the imaging position of a laser point on two cameras to achieve a precise matching result. The process involves a calibration database that enhances the accuracy of the measurements. Another notable patent is a target detection method and apparatus, which involves controlling a modulated light emitting device to emit optical pulse signals. This method distinguishes between a target and its background by analyzing images captured by an image sensor.

Career Highlights

Danwei Shi is currently employed at Shenzhen Taishan Online Technology Co., Ltd. His work at this company focuses on advancing measurement technologies and enhancing the capabilities of structured-light systems. His innovative approaches have garnered attention in the industry and contributed to the company's reputation for technological excellence.

Collaborations

Danwei Shi collaborates with talented individuals such as Kun Zhou and Di Wu. Their combined expertise fosters a creative environment that drives innovation and leads to the development of cutting-edge technologies.

Conclusion

Danwei Shi's contributions to structured-light measurement technologies exemplify his dedication to innovation. His patents reflect a commitment to advancing measurement methods and systems, making a significant impact in his field.