Guangzhou, China

Qi Xie

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Grg Banking Equipment Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qi Xie. Retrieved from https://idiyas.com/inventor/qi-xie-jkno790i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Qi Xie

Introduction

Qi Xie is a notable inventor based in Guangzhou, China. He has made significant contributions to the field of measurement technology, particularly with his innovative designs. His work focuses on enhancing the accuracy and efficiency of thickness measurement devices for sheet-type mediums.

Latest Patents

Qi Xie holds a patent for a "Thickness measurement device for sheet-type medium." This device comprises several components, including a fixing frame, a reference shaft with a reference roller, a detection shaft with a floating support frame, a detection roller, a signal generator, an elastic pressing plate, a signal sensor, and a data processing unit. The device is designed to provide system damping through friction between elastic sheets, reducing the impact peak value of output signals and shortening the adjustment time of oscillation.

Career Highlights

Qi Xie is currently employed at Grg Banking Equipment Co., Ltd., where he continues to develop innovative solutions in measurement technology. His work has been instrumental in advancing the capabilities of thickness measurement devices, making them more reliable and efficient.

Collaborations

Qi Xie has collaborated with several talented individuals, including Wenqing Wu and Xing Hu. Their combined expertise has contributed to the successful development of various projects within their field.

Conclusion

Qi Xie's contributions to measurement technology exemplify the spirit of innovation and collaboration in the industry. His patented device showcases his commitment to improving accuracy and efficiency in thickness measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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