Seoul, South Korea

Pyeong-Woo Lee

This inventor holds 2 USPTO granted patents. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2013-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pyeong-Woo Lee. Retrieved from https://idiyas.com/inventor/pyeong-woo-lee-7z09nlrb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013-2014

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2 patents (USPTO):Explore Patents

Title: Innovations by Pyeong-Woo Lee

Introduction

Pyeong-Woo Lee is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of image processing technology. With a total of 2 patents, his work focuses on improving the quality of image signals.

Latest Patents

Pyeong-Woo Lee's latest patents include a method of processing image signals and a related method of image capture. This method involves determining whether each unit of input pixel data from an image sensor is bad pixel data or normal pixel data. The process performs interpolation to generate image data corresponding to the bad pixel using only normal pixel data, effectively omitting the bad pixel data. Another patent addresses similar issues using interpolation to enhance image signal processing.

Career Highlights

Pyeong-Woo Lee is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate in the field of image processing. His work has been instrumental in advancing the technology used in various imaging devices.

Collaborations

Some of his notable coworkers include Dong-Jae Lee and Byung-joon Baek, who collaborate with him on various projects within the company.

Conclusion

Pyeong-Woo Lee's contributions to image processing technology through his patents demonstrate his expertise and commitment to innovation. His work continues to influence advancements in the field, making a significant impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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