Bhopal, India

Pulkit Rathi

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Dell Products Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pulkit Rathi. Retrieved from https://idiyas.com/inventor/pulkit-rathi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Pulkit Rathi and Distributed Fault Detection

Introduction

Pulkit Rathi is an inventor based in Bhopal, India. His patent work includes a distributed fault-detection approach that uses neural networks to identify faults in physical environments.

Latest Patents

Rathi is associated with 1 patent, titled “Distributed fault detection.” The invention describes a first computing node that receives sensor data and analyzes it using a restricted Boltzmann machine (RBM) neural network. The network is trained without fault-condition identifications, enabling it to detect conditions not explicitly labeled in its training data. The node updates its model using the sensor data and sends a patch representing the updated model to a central server. The server aggregates that patch with a patch from a second computing node and returns information about a further updated RBM neural network.

Career Highlights

Rathi is associated with Dell Products Inc. His patent describes a distributed approach to updating fault-detection models across computing nodes and a central server.

Collaborations

Rathi’s listed coworker is Daniel Barrett. The patent also describes coordination between a first and a second computing node through patches aggregated by a central server.

Conclusion

Pulkit Rathi’s “Distributed fault detection” patent focuses on collaborative, adaptive fault detection using sensor data and updated RBM neural networks.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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