Ft. Collins, CO, United States of America

Protik Mia


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Protik Mia - Innovator in Test Coverage Tools

Introduction

Protik Mia is a notable inventor based in Ft. Collins, CO (US). He has made significant contributions to the field of logic circuit design through his innovative patent. His work focuses on enhancing the efficiency and accuracy of test coverage tools, which are essential for validating logic paths in circuit designs.

Latest Patents

Protik Mia holds a patent for a "Speed Coverage Tool and Method." This invention is designed to determine the adequacy of a set of test vectors for a state simulator, which exercises logic paths in a logic circuit design. The speed coverage tool compares state data from a state simulator with timing data from a timing simulator to validate whether a test vector adequately covers a simulated timing path. The architecture of the tool includes logic components that acquire state data, obtain timing data, and determine a transition score that indicates the adequacy of the test vectors. Additionally, the tool analyzes sensitization data to produce a sensitization score, enhancing the accuracy of coverage assessment.

Career Highlights

Protik Mia is currently employed at Hewlett-Packard Company, where he continues to innovate in the field of test coverage tools. His work has been instrumental in improving the reliability of logic circuit designs, making significant strides in the industry.

Collaborations

Protik has collaborated with notable coworkers, including Li Ching Tsai and Floyd E Moore. Their combined expertise has contributed to the advancement of technologies in the field of logic circuit design.

Conclusion

Protik Mia's contributions to the development of test coverage tools exemplify his commitment to innovation in the field of logic circuit design. His patent for the speed coverage tool showcases his ability to enhance the accuracy and efficiency of testing processes.

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