Sangli, India

Prasad Venikar

This inventor holds 1 USPTO granted patent. Top assignee: Abb Schweiz Ag. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Prasad Venikar. Retrieved from https://idiyas.com/inventor/prasad-venikar-l1530118

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations by Prasad Venikar in Condition Monitoring Technology

Introduction

Prasad Venikar is an innovative inventor based in Sangli, India. He has made significant contributions to the field of condition monitoring for rotating equipment. His work focuses on enhancing the reliability and efficiency of machinery through advanced monitoring techniques.

Latest Patents

Prasad Venikar holds a patent for a "Method and a condition monitoring device for monitoring a rotating equipment." This method involves monitoring rotating equipment at predetermined intervals. It includes detecting vibrations through sensors and calculating a Root Mean Square (RMS) value to assess the equipment's condition. The process allows for timely maintenance and operational efficiency.

Career Highlights

Prasad is currently associated with Abb Schweiz AG, where he applies his expertise in condition monitoring. His work contributes to the development of innovative solutions that improve the performance and longevity of rotating machinery.

Collaborations

Prasad has collaborated with notable colleagues, including Maciej Orman and Manuel Oriol. These partnerships enhance the research and development efforts within his field.

Conclusion

Prasad Venikar's contributions to condition monitoring technology exemplify the importance of innovation in engineering. His patent reflects a commitment to improving machinery reliability and operational efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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