Campbell, CA, United States of America

Prasad Vajjhala

This inventor holds 1 USPTO granted patent. Top assignee: Koninklijke Philips Corporation N.v.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Prasad Vajjhala. Retrieved from https://idiyas.com/inventor/prasad-vajjhala-4fk79mhb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Prasad Vajjhala: Innovator in Debugging Technology

Introduction

Prasad Vajjhala is a notable inventor based in Campbell, California. He has made significant contributions to the field of debugging technology, particularly through his innovative patent related to internal scan testing.

Latest Patents

Vajjhala holds a patent for a "Test access port (TAP) controller system and method to debug internal intermediate scan test faults." This invention facilitates simplified debugging of internal component scan testing. The system includes an intermediate TAP controller internal scan test system, design circuit blocks, a scan test chain primary input pin, and a scan test chain final output pin. The components work together to enable the extraction of intermediate scan test chain signals, which aids in identifying faults. The intermediate TAP controller transmits the indicated intermediate scan test chain signal off the integrated circuit as a TAP test data out (TDO) signal. Additionally, it utilizes an internal scan observe register to store information on which intermediate internal scan test chain signal to forward as a TAP TDO signal.

Career Highlights

Prasad Vajjhala is currently employed at Koninklijke Philips Corporation N.V., where he continues to develop and refine technologies that enhance debugging processes. His work has been instrumental in advancing the capabilities of internal scan testing.

Collaborations

Vajjhala collaborates with various professionals in his field, including his coworker Ken Jaramillo, to further innovate and improve debugging technologies.

Conclusion

Prasad Vajjhala's contributions to debugging technology through his patent demonstrate his commitment to innovation and excellence in the field. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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