Palo Alto, CA, United States of America

Prakash Reddy

This inventor holds 2 USPTO granted patents. Top assignee: Peridot Print LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Prakash Reddy. Retrieved from https://idiyas.com/inventor/prakash-reddy-36bbt7jv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Prakash Reddy: Inventor in 3D Printing Anomaly Detection.

Introduction

Prakash Reddy is an inventor based in Palo Alto, California. His patent work focuses on detecting anomalies in three-dimensional printing, including methods designed to identify problems as a print job is underway. He is associated with Peridot Print LLC and has 2 patents.

Latest Patents

Reddy’s latest patents address complementary approaches to anomaly detection in 3D printers.

“Triangulation-Based Anomaly Detection in Three-Dimensional Printers” describes using two models to generate predicted anomalies from data about printed layers. The predictions are then triangulated to detect an anomaly in a layer being printed.

“Real-Time Anomaly Detection in Three-Dimensional Printers” describes processing data from previously printed layers alongside data from the layer currently being printed. An anomaly detection engine uses these data to identify potential problems in real time.

Career Highlights

Reddy’s listed patent work centers on applying data analysis and predictive models to 3D printing. Together, the two inventions describe ways to detect print anomalies by comparing model predictions and by analyzing current printing data against information from earlier layers.

Collaborations

Reddy is associated with Peridot Print LLC. His listed coworkers include Amit Kumar and Hariharan Rajaram.

Conclusion

Prakash Reddy’s patent portfolio focuses on triangulation-based and real-time methods for detecting anomalies in three-dimensional printing, with the aim of identifying issues during the printing process.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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