Mumbai, India

Pradeep Kalarickakudy Vijayan

This inventor holds 1 USPTO granted patent. Top assignee: Bank of America Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pradeep Kalarickakudy Vijayan. Retrieved from https://idiyas.com/inventor/pradeep-kalarickakudy-vijayan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Pradeep Kalarickakudy Vijayan: Inventor in Process Monitoring

Introduction

Pradeep Kalarickakudy Vijayan is an inventor based in Mumbai, India, and is associated with Bank of America Corporation. His work includes an invention focused on centralized analysis and monitoring of backend process data.

Latest Patents

Vijayan is credited with 1 patent: “System and Method for Centralized Analysis and Monitoring of Process Data via Baseline Data Mapping.” The patent describes systems, computer program products, and methods for retrieving backend processes and storing baseline data that records the status of enabled processes. The system monitors those processes at predetermined intervals, stores updated status information, and compares it with the corresponding baseline data. It can then generate a report or update a process status portal.

Career Highlights

Vijayan’s patented work addresses the centralized monitoring of backend processes. By comparing current process statuses with baseline data, the described system supports the identification and reporting of changes in process status.

Collaborations

Vijayan’s listed coworkers include Prabhat Ranjan and Shilpa Banerjee. His professional association with Bank of America Corporation provides context for his work in process monitoring.

Conclusion

Pradeep Kalarickakudy Vijayan’s patent presents an approach to tracking backend processes through baseline comparisons, scheduled monitoring, and status reporting.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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