Palo Alto, CA, United States of America

Pradeep Fernando

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Hewlett Packard Enterprise Development LP. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pradeep Fernando. Retrieved from https://idiyas.com/inventor/pradeep-fernando-czo6wvo6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Pradeep Fernando: Innovator in Fault Tolerance Technology

Introduction

Pradeep Fernando is a notable inventor based in Palo Alto, California. He has made significant contributions to the field of fault tolerance in shared memory systems. His innovative work has led to the development of a patent that addresses critical challenges in data management and reliability.

Latest Patents

Pradeep holds a patent for "Fault tolerance in shared memory." This patent involves a metadata store of a shared memory that indicates versions of data partitions of a resilient distributed dataset. It also includes a valid flag for the partitions of the resilient distributed dataset, which is utilized to achieve fault tolerance and recover from faults in shared memory. This invention is crucial for enhancing the reliability of distributed systems.

Career Highlights

Pradeep Fernando is currently employed at Hewlett Packard Enterprise Development LP, where he continues to work on innovative solutions in technology. His expertise in fault tolerance has positioned him as a valuable asset in his field.

Collaborations

Pradeep has collaborated with talented individuals such as Mijung Kim and Haris Volos. Their combined efforts contribute to advancing technology and improving system reliability.

Conclusion

Pradeep Fernando's work in fault tolerance technology exemplifies the importance of innovation in enhancing data reliability. His contributions through patents and collaborations continue to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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