Karnataka, India

Pradeep Bansal

This inventor holds 1 USPTO granted patent. Top assignee: Oracle International Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pradeep Bansal. Retrieved from https://idiyas.com/inventor/pradeep-bansal-w6tif7hi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Pradeep Bansal and Intelligent Intercompany Accounting

Introduction

Pradeep Bansal is an inventor based in Karnataka, India, with one patent listed in the provided information. His work focuses on applying machine learning to accounting processes, particularly the resolution of discrepancies between entities’ financial records.

Latest Patents

Bansal’s patent, “Automatically and Intelligently Creating Journal Entries to Solve Mismatches Identified via the Intercompany Elimination Reporting Process,” describes systems and methods for generating journal entries to address intercompany mismatches. A machine-learning model is trained using characteristics of historical journal entries associated with past discrepancies. The model can then generate an entry that records and reconciles a discrepancy between data from two entities, aligning the ledger with one entity’s entry or the other’s. The provided information lists 1 patent.

Career Highlights

Bansal is associated with Oracle International Corporation. His patented work addresses the automation of intercompany accounting, using historical data and machine learning to support the creation of journal entries that resolve reporting discrepancies.

Collaborations

The provided information names Margaret Reed and Sunil Sahu as Bansal’s coworkers. It does not specify their roles in the patent or describe particular collaborations.

Conclusion

Pradeep Bansal’s listed patent applies machine learning to a practical accounting challenge by automating journal-entry creation for intercompany discrepancies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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