Dublin, CA, United States of America

Poonam Chandramohan Dhanwani

This inventor holds 1 USPTO granted patent. Top assignee: Walmart Apollo, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Poonam Chandramohan Dhanwani. Retrieved from https://idiyas.com/inventor/poonam-chandramohan-dhanwani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Poonam Chandramohan Dhanwani: Inventor in Time-Series Anomaly Detection

Introduction

Poonam Chandramohan Dhanwani is an inventor based in Dublin, California. Her patent work addresses anomaly detection in large-scale production environments, applying time-series modeling to identify unusual patterns in operational data.

Latest Patents

Dhanwani is named on 1 patent: “Systems and Methods of Anomaly Detection in Large Scale Production Environments Using Time-Series Modeling.” The patent describes receiving a time-series dataset and generating a forecast with a trained generalized forecasting model that uses a fixed set of characteristic features. The system compares the forecast with the observed data to determine whether an anomaly is present and, when one is identified, sends a notification to an associated system.

Career Highlights

Dhanwani is associated with Walmart Apollo, LLC. Her patent reflects work on using generalized forecasting models to support anomaly identification in production environments.

Collaborations

The provided information lists Krishna Koti Keshva Srinivas and Ekta Gujral as Dhanwani’s coworkers. It does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Poonam Chandramohan Dhanwani’s patent focuses on applying time-series forecasting to detect and report anomalies in large-scale production environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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