Hsinchu, Taiwan

Po-Hsuan Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Faraday Technology Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Po-Hsuan Lee. Retrieved from https://idiyas.com/inventor/po-hsuan-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Po-Hsuan Lee: Innovator in Ethernet Technology

Introduction

Po-Hsuan Lee is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of Ethernet technology, particularly with his innovative patent that addresses link down detection.

Latest Patents

One of Po-Hsuan Lee's key patents is titled "Link Down Detector and Link Down Detecting Method for Ethernet." This invention provides a method for detecting link down status in Ethernet connections. The method involves receiving a signal, extracting a high-frequency band signal, and calculating power values to determine if a network device has switched to a link down status. This innovation enhances the reliability of Ethernet networks.

Career Highlights

Po-Hsuan Lee is currently employed at Faraday Technology Corporation, where he continues to develop cutting-edge technologies. His work focuses on improving network communication and ensuring efficient data transmission.

Collaborations

Some of his coworkers include I-Chuan Chiu and Shih-Yi Shih, who contribute to the collaborative environment at Faraday Technology Corporation.

Conclusion

Po-Hsuan Lee's contributions to Ethernet technology through his innovative patent demonstrate his commitment to advancing network communication. His work is essential for enhancing the reliability and efficiency of modern networking systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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