Company Filing History:
Years Active: 2025
Title: Po-Ching He: Innovator in Nanostructure Analysis
Introduction
Po-Ching He is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of nanotechnology, particularly in the analysis of three-dimensional nanostructures. His innovative methods have the potential to advance various applications in materials science and engineering.
Latest Patents
Po-Ching He holds a patent titled "Method for determining parameters of three-dimensional nanostructure and apparatus applying the same." This patent describes a method for determining parameters of nanostructures by obtaining an X-ray reflection intensity measurement curve. The method involves comparing this curve with a standard curve to derive essential parameters of the nanostructure being tested. He has 1 patent to his name, showcasing his expertise in this specialized area.
Career Highlights
He is currently affiliated with the Industrial Technology Research Institute, where he continues to work on innovative projects related to nanotechnology. His research focuses on enhancing the understanding and characterization of nanostructures, which is crucial for the development of advanced materials.
Collaborations
Po-Ching He collaborates with Wei-En Fu, who is also involved in research and development within the same field. Their partnership exemplifies the collaborative spirit that drives innovation in scientific research.
Conclusion
Po-Ching He is a prominent figure in the realm of nanotechnology, with a focus on developing methods for analyzing nanostructures. His contributions are paving the way for future advancements in this critical area of research.