San Ramon, CA, United States of America

Piyush C Modi

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nvidia Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Piyush C Modi. Retrieved from https://idiyas.com/inventor/piyush-c-modi-ifszfbtw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Piyush C Modi: Innovator in Defect Detection Technology

Introduction

Piyush C Modi is a notable inventor based in San Ramon, California. He has made significant contributions to the field of defect detection using advanced neural network technologies. His work focuses on enhancing the quality control processes in manufacturing, particularly in the production of printed circuit boards (PCBs).

Latest Patents

Piyush holds a patent for "Defect detection using one or more neural networks." This patent describes apparatuses, systems, and techniques that facilitate feature detection of manufactured objects, such as PCBs, by utilizing combined images. In one embodiment, an automated optical inspection system (AOI) employs one or more neural networks to infer the existence of defects on a PCB based on these combined images. This innovation is crucial for improving the reliability and efficiency of manufacturing processes.

Career Highlights

Piyush currently works at Nvidia Corporation, a leading technology company known for its advancements in graphics processing and artificial intelligence. His role at Nvidia allows him to leverage cutting-edge technology to develop solutions that address complex manufacturing challenges.

Collaborations

Piyush collaborates with Prakash Gurumurthy, a fellow innovator at Nvidia. Together, they work on projects that push the boundaries of technology in defect detection and quality assurance.

Conclusion

Piyush C Modi's contributions to defect detection technology exemplify the impact of innovation in manufacturing. His work not only enhances product quality but also showcases the potential of neural networks in industrial applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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