Kaohsiung, Taiwan

Pin-Ching Su

This inventor holds 1 USPTO granted patent. Top assignees: Novatek Microelectronics Corp., Tsinghua University. Active years: 2015.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovations of Pin-Ching Su

Introduction

Pin-Ching Su is a notable inventor based in Kaohsiung, Taiwan. He has made significant contributions to the field of image processing, particularly in the area of image alignment. His innovative methods have the potential to enhance various applications in technology and imaging.

Latest Patents

One of Pin-Ching Su's key patents is an image processing method and image processing device for image alignment. This patent describes a method that involves sequentially receiving a plurality of images. It generates at least one threshold corresponding to each image based on a variety of intensities. The method converts each image according to these thresholds, resulting in a series of binary images. It also acquires characteristic pixels from each binary image and aligns the images based on these pixels. This innovative approach has the potential to improve the accuracy and efficiency of image processing tasks.

Career Highlights

Throughout his career, Pin-Ching Su has worked with prominent organizations such as Novatek Microelectronics Corporation and Tsing Hua University. His experience in these institutions has allowed him to develop and refine his skills in image processing and technology.

Collaborations

Pin-Ching Su has collaborated with several talented individuals, including Ming-Feng Chiang and Hwann-Tzong Chen. These collaborations have contributed to the advancement of his research and innovations in the field.

Conclusion

Pin-Ching Su's contributions to image processing and his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
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