Piers Echols-Jones

Title: Piers Echols-Jones: Innovator in Atomic Force Microscopy

Introduction

Piers Echols-Jones is a notable inventor based in Medford, MA (US). He has made significant contributions to the field of atomic force microscopy, particularly through his innovative patent.

Latest Patents

Echols-Jones holds a patent titled "Feedback correction in sub-resonant tapping mode of an atomic force microscope." This patent describes a method for conducting sub-resonant tapping in an atomic force microscope. The method involves translating a probe above a sample in a direction parallel to the horizontal plane defined by the sample while oscillating it vertically. This process allows the probe to repeatedly tap the surface of the sample, beginning with an initial contact and progressively increasing the force until a peak force is reached. The vertical offset is controlled based on features other than the peak force, enhancing the precision of the measurements.

Career Highlights

Echols-Jones is affiliated with Tufts College, where he applies his expertise in atomic force microscopy. His work has contributed to advancements in the understanding and application of this technology.

Collaborations

He has collaborated with notable colleagues, including William C Messner and Igor Sokolov, further enriching his research and innovation efforts.

Conclusion

Piers Echols-Jones is a distinguished inventor whose work in atomic force microscopy has paved the way for enhanced measurement techniques. His contributions continue to influence the field and inspire future innovations.