Company Filing History:
Years Active: 2022
Title: Pierre Vernhes - Innovator in Topographic Measurement Technology
Introduction
Pierre Vernhes is a notable inventor based in Saint Martin d'Uriage, France. He has made significant contributions to the field of topographic measurement with his innovative device designed to measure the surface topography of various samples. His work exemplifies the intersection of technology and precision measurement.
Latest Patents
Pierre Vernhes holds a patent for a topographic measurement device. This device includes a projector that projects a structured image onto the surface of a sample. A camera observes the projected image, while a heating device applies a temperature ramp to the sample. The first optic device, located on the optic axis of the projector, modifies the emitted image and applies it to the sample. This device features several distinct lenses that define different magnifications and are movable with respect to one another. Additionally, a second optic device on the camera's optic axis modifies the size of the observation area on the sample's surface, also utilizing several distinct lenses with different magnifications.
Career Highlights
Pierre Vernhes is associated with Insidix, where he continues to develop and refine his innovative technologies. His work has garnered attention for its potential applications in various scientific and industrial fields.
Collaborations
Some of his notable coworkers include Cyrille Jacquet and Régis Braisaz, who contribute to the collaborative efforts at Insidix.
Conclusion
Pierre Vernhes stands out as an inventor whose work in topographic measurement technology showcases his commitment to innovation and precision. His contributions are paving the way for advancements in measurement techniques.