The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2022
Filed:
Apr. 29, 2019
Insidix, Seyssins, FR;
Pierre Vernhes, Saint Martin d'Uriage, FR;
Cyrille Jacquet, Gieres, FR;
RĂ©gis Braisaz, Reaumont, FR;
Pierre-Louis Toussaint, Grenoble, FR;
INSIDIX, Seyssins, FR;
Abstract
A device for measuring the surface topography of a sample includes a projector which projects a structured image onto the surface of the sample. A camera observes the image projected onto the surface of the sample. A heating device applies a temperature ramp on the sample. A first optic device located on the optic axis of the projector modifies the image emitted by the projector and applies it on the sample. The first optic device includes several distinct lenses defining different magnifications. The lenses are fitted movable with respect to one another. A second optic device is located on the optic axis of the camera to modify the size of the observation area on the surface of the sample. The second optic device includes several distinct lenses presenting different magnifications. The lenses are fitted movable to define several observation areas of different sizes.