Chambéry, France

Pierre Vacher

This inventor holds 1 USPTO granted patent. Top assignees: One Ortho, Université Savoie Mont Blanc. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pierre Vacher. Retrieved from https://idiyas.com/inventor/pierre-vacher-5qsdbc1p

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Pierre Vacher: Innovator in Three-Dimensional Scanning Technology

Introduction

Pierre Vacher is a notable inventor based in Chambéry, France. He has made significant contributions to the field of three-dimensional scanning technology. His innovative work has led to the development of a unique stylus designed for manual probing systems.

Latest Patents

Pierre Vacher holds a patent for a stylus used in a three-dimensional scanning system. This stylus includes a probe and a locator with multiple markers. Each marker has a distinct code and orientation, allowing at least two visible markers to be read by a camera from any viewpoint during probing conditions. This invention enhances the accuracy and efficiency of three-dimensional scanning.

Career Highlights

Throughout his career, Pierre has worked with reputable organizations, including One Ortho and Université Savoie Mont Blanc. His experience in these institutions has contributed to his expertise in the field of scanning technology.

Collaborations

Pierre has collaborated with professionals such as Christian Elmo Kulanesan and Ludovic Charleux. These partnerships have further enriched his work and innovations in three-dimensional scanning systems.

Conclusion

Pierre Vacher's contributions to three-dimensional scanning technology exemplify his innovative spirit and dedication to advancing the field. His patent and collaborations reflect his commitment to enhancing the capabilities of scanning systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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