Pierre Marquet

Title: Pierre Marquet: Innovator in Refractive Index Measurement

Introduction

Pierre Marquet is a notable inventor based in Stoneham-et-Tewkesbury, Canada. He has made significant contributions to the field of optical measurement, particularly through his innovative patent that addresses the determination of refractive indices in various media. His work is essential for advancements in optical technologies and applications.

Latest Patents

Pierre Marquet holds a patent for a "System and method for measuring a refractive index of a medium." This patent describes a method that involves providing a substrate with a surface that has two spaced-apart portions. The method includes receiving a medium on one of the surface portions, propagating optical beams towards both portions, and collecting signals indicative of the phase of the collected beams. The refractive index of the medium is then determined based on these signals, the depth of the surface portions, the wavelength of the optical beams, and the refractive index of the substrate. This innovative approach enhances the accuracy and efficiency of refractive index measurements.

Career Highlights

Pierre Marquet is affiliated with Université Laval, where he continues to engage in research and development in the field of optics. His work has contributed to the understanding and application of optical measurement techniques, making him a valuable asset to the academic and scientific community.

Collaborations

Pierre has collaborated with notable colleagues such as Érik Belanger and Bertrand De Dorlodot. These collaborations have fostered a productive environment for innovation and have led to advancements in their respective fields.

Conclusion

Pierre Marquet's contributions to the field of optical measurement through his innovative patent demonstrate his commitment to advancing technology. His work not only enhances the understanding of refractive indices but also paves the way for future developments in optical applications.