The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2025
Filed:
Jan. 30, 2020
Université Laval, Québec, CA;
Érik Belanger, Québec, CA;
Pierre Marquet, Stoneham-et-Tewkesbury, CA;
Bertrand De Dorlodot, Québec, CA;
Réal Vallée, Québec, CA;
UNIVERSITÉ LAVAL, Quebec, CA;
Abstract
There is described a method for determining a refractive index of a medium. The method generally has providing a substrate having a surface, the surface having a first surface portion and a second surface portion spaced-apart from the first surface portion and recessed of a depth relative to the first surface portion; receiving the medium at least on the second surface portion; propagating a first optical beam towards the first surface portion and a second optical beam towards the second surface portion; collecting the first and second optical beams after said propagating and generating first and second signals being indicative of a phase of a respective one of the first and second collected optical beams; and determining a refractive index of said medium based on the first and second signals, the depth, a wavelength associated to the first and second optical beams and a refractive index of the substrate.