Company Filing History:
1 out of 5,094 
1 out of 3 Years Active: 2015
Title: Pierre-Emmanuel Mazeran: Innovator in Scanning Probe Microscopy
Introduction
Pierre-Emmanuel Mazeran is a notable inventor based in Compiègne, France. He has made significant contributions to the field of surface measurement and modification through his innovative work in scanning probe microscopy. His expertise has led to the development of advanced techniques that enhance our understanding of surface interactions.
Latest Patents
Mazeran holds a patent for "Processes for surface measurement and modification by scanning probe microscopy functioning in continuous curvilinear mode, scanning probe microscope and device permitting their implementation of said methods." This invention focuses on processes for modifying surfaces and measuring adhesion forces, including friction and adhesion forces, using scanning probe microscopy in a continuous curvilinear mode. The patent highlights the importance of these processes in various scientific and industrial applications.
Career Highlights
Throughout his career, Mazeran has worked with prestigious institutions such as the Centre National de la Recherche Scientifique and Université du Maine (Le Mans). His work in these organizations has allowed him to advance research in surface science and microscopy techniques.
Collaborations
Mazeran has collaborated with notable colleagues, including Olivier Noel and Hussein Nasrallah. These partnerships have contributed to the development of innovative solutions in the field of microscopy.
Conclusion
Pierre-Emmanuel Mazeran's contributions to scanning probe microscopy and surface measurement techniques have established him as a key figure in his field. His innovative patent and collaborations reflect his commitment to advancing scientific knowledge and technology.