The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2015
Filed:
May. 05, 2011
Applicants:
Olivier Noel, Neuville sur Sarthe, FR;
Pierre-emmanuel Mazeran, Compiegne, FR;
Hussein Nasrallah, Le Mans, FR;
Inventors:
Olivier Noel, Neuville sur Sarthe, FR;
Pierre-Emmanuel Mazeran, Compiegne, FR;
Hussein Nasrallah, Le Mans, FR;
Assignees:
Centre National de la Recherche Scientifique-CNRS, Paris, FR;
Universite du Maine (Le Mans), Le Mans Cedex, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01Q 60/26 (2010.01); G01Q 60/28 (2010.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01Q 60/26 (2013.01); G01Q 60/28 (2013.01); B82Y 35/00 (2013.01);
Abstract
The invention relates to processes for the modification of surfaces and on processes for the measurement of adhesion forces and of different forces of interaction (friction forces, adhesion forces) by scanning probe microscopy functioning in continuous <<curvilinear>> mode, as well as to a scanning probe microscope and a device permitting the implementation of said processes.