FR

Pierre Dumouchel

This inventor holds 0 USPTO granted patents, plus 1 CIPO patent.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pierre Dumouchel. Retrieved from https://idiyas.com/inventor/pierre-dumouchel-0mj477kp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Title: Pierre Dumouchel: Innovator in Surgical Instrumentation

Introduction

Pierre Dumouchel is a notable inventor based in France, recognized for his contributions to the field of surgical instrumentation. His innovative approach focuses on enhancing the traceability of surgical instruments, which is crucial for patient safety and effective medical procedures.

Latest Patents

Dumouchel holds a patent titled "Système Et Procédé De Traçabilité D'un Système D'instrumentation Chirurgicale." This invention relates to a surgical instrumentation system that includes a set of disposable instruments designed for fitting implants, along with sterile implants. Each set is equipped with a unique identifier, which is essential for tracking and ensuring the proper use of surgical tools during operations. The system also incorporates a method for recording additional identifiers, such as patient codes, which are collected during the use of the instruments.

Career Highlights

Pierre Dumouchel is currently associated with Safe Orthopaedics, a company dedicated to advancing surgical techniques and improving patient outcomes through innovative medical solutions. His work at Safe Orthopaedics emphasizes the importance of traceability in surgical procedures, which can significantly reduce the risk of errors and enhance the overall quality of care.

Collaborations

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Conclusion

Pierre Dumouchel's contributions to surgical instrumentation highlight the importance of innovation in the medical field. His work not only improves surgical practices but also prioritizes patient safety through effective traceability systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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