Florence, Italy

Pierluigi Cuomo

This inventor holds 1 USPTO granted patent. Top assignee: Imperial College Innovations Limited. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pierluigi Cuomo. Retrieved from https://idiyas.com/inventor/pierluigi-cuomo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Pierluigi Cuomo: Innovator in Surface Scanning Technology

Introduction

Pierluigi Cuomo is a notable inventor based in Florence, Italy. He has made significant contributions to the field of surface scanning technology, particularly with his innovative attachment designed for devices that scan surfaces.

Latest Patents

Cuomo holds a patent for an "Attachment for use with a device to scan a surface and a device for the same." This invention features a first housing portion that securely holds a camera device, a second housing portion with a wall defining internal and external regions, and multiple pins that translate upon contact with a surface. This design allows the camera to capture images of the proximal ends of the pins, enhancing the scanning process.

Career Highlights

Cuomo is associated with Imperial College Innovations Limited, where he applies his expertise in developing advanced scanning technologies. His work has the potential to impact various fields, including medical imaging and surface analysis.

Collaborations

He has collaborated with notable colleagues such as Anthony Bull and Marco Hanaman, contributing to the advancement of innovative technologies in their respective fields.

Conclusion

Pierluigi Cuomo's contributions to surface scanning technology exemplify the spirit of innovation. His patent and collaborative efforts highlight the importance of advancements in this area, paving the way for future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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