This inventor holds 4 USPTO granted patents and 2 published patent applications. Top assignees: Rapiscan Systems, Inc., Rapiscan Security Products, Inc.. Active years: 2007-2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007-2013
Title: Phong Nguyen: Innovator in X-Ray Inspection Technology
Introduction
Phong Nguyen is a notable inventor based in Tustin, California, recognized for his contributions to x-ray inspection technology. He holds a total of 4 patents, showcasing his innovative approach to enhancing security measures through advanced imaging techniques.
Latest Patents
One of his latest patents is a method and system for certifying operators of x-ray systems. This invention utilizes Threat Imaging Projection (TIP) technology to ensure that x-ray inspection system operators meet a uniform level of performance. The system allows operators to view x-ray images on a screening system equipped with TIP technology. When an operator identifies a potential threat item, they can indicate this through a designated means. The system records and transmits performance data, including proper detections, missed detections, and false alarms. Additionally, it features a library of various threat item images, such as guns, bombs, and knives, classified by type and difficulty of detection.
Career Highlights
Phong Nguyen has worked with reputable companies in the security sector, including Rapiscan Systems, Inc. and Rapiscan Security Products, Inc. His experience in these organizations has significantly contributed to his expertise in x-ray inspection technologies.
Collaborations
Throughout his career, Nguyen has collaborated with professionals such as Peter Modica and Khai M Le, further enhancing his innovative projects and contributions to the field.
Conclusion
Phong Nguyen's work in x-ray inspection technology exemplifies his commitment to improving security measures through innovation. His patents and career achievements reflect his significant impact on the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

