Rockville, MD, United States of America

Phillippe M Burlina

This inventor holds 1 USPTO granted patent. Top assignee: Johns Hopkins University. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Phillippe M Burlina. Retrieved from https://idiyas.com/inventor/phillippe-m-burlina

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2012

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Phillippe M. Burlina and Hyperspectral Object Tracking.

Introduction

Phillippe M. Burlina is an inventor based in Rockville, Maryland, and is associated with Johns Hopkins University. His patent work addresses remote detection and tracking of objects using hyperspectral video sensors.

Latest Patents

Burlina is credited with 1 patent: “Systems and Methods for Remote Tagging and Tracking of Objects Using Hyperspectral Video Sensors.” The invention detects and tracks objects by comparing the spectrum of each image pixel with a known spectral signature. It uses radiative transfer theory to estimate an object’s reflectance from measured radiance, helping account for changes in illumination. Because reflectance signatures can remain consistent across varying conditions, the method can support tracking through gaps in spatial or temporal coverage. Tracking combines a prediction process with a correction process.

Career Highlights

The patent highlights Burlina’s work on applying hyperspectral imaging and reflectance analysis to remote object tracking. His affiliation with Johns Hopkins University connects this work to the university’s research and innovation community.

Collaborations

The patent’s listed collaborators include Joshua B. Broadwater and Amit Banerjee.

Conclusion

Phillippe M. Burlina’s patented approach uses hyperspectral signatures and reflectance estimation to help detect and track objects despite changing illumination and interruptions in sensor coverage.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…