Company Filing History:
Years Active: 2001-2007
Title: The Innovations of Phillip E Byrd
Introduction
Phillip E Byrd is a notable inventor based in Boise, ID (US), recognized for his contributions to the field of semiconductor technology. With a total of 14 patents to his name, Byrd has made significant advancements that enhance the efficiency and reliability of semiconductor testing.
Latest Patents
One of Byrd's latest patents is a method to prevent damage to probe cards. Probe cards are configured with protective circuitry suitable for use in electrical testing of semiconductor dice without damage to the probe cards. Protective fuses are provided in electrical communication with conductive traces and probe elements, such as probe needles, of a probe card. The fuses may be active or passive fuses and are preferably self-resetting, repairable, and/or replaceable. Typically, the fuses will be interposed in, or located adjacent to, conductive traces residing over a surface of the probe card. Methods of fabricating a probe card are provided, as well as various probe card configurations. A semiconductor die testing system using the probe card is also included in his innovations.
Career Highlights
Phillip E Byrd has built a successful career at Micron Technology Incorporated, where he has been instrumental in developing technologies that improve semiconductor testing processes. His work has not only contributed to the company's success but has also advanced the industry as a whole.
Collaborations
Byrd has collaborated with several talented individuals, including Tim G Damon and Paul R Sharratt, who have worked alongside him in various projects at Micron Technology Incorporated.
Conclusion
Phillip E Byrd's innovative contributions to semiconductor technology, particularly in the area of probe card protection, highlight his importance as an inventor. His work continues to influence the field and improve testing methodologies in the semiconductor industry.