Haguenau, France

Philippe Sierro

This inventor holds 1 USPTO granted patent. Top assignee: Thermo Electron (Karlsruhe) Gmbh. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philippe Sierro. Retrieved from https://idiyas.com/inventor/philippe-sierro

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations of Philippe Sierro in Rheometry

Introduction

Philippe Sierro is a notable inventor based in Haguenau, France. He has made significant contributions to the field of rheometry, particularly with his innovative designs and patents. His work focuses on the development of instruments that measure the flow and deformation of materials.

Latest Patents

Philippe Sierro holds a patent for a rheometer or viscometer. This device features a first measuring part and a second measuring part, creating a sample space for receiving a material sample. The rheometer is equipped with a drive device that allows the second measuring part to be rotated and/or oscillated. The drive movement is transferred to the second measuring device via a transmission element, which penetrates through the first measuring part, particularly at a through-bore.

Career Highlights

Philippe Sierro is associated with Thermo Electron GmbH, located in Karlsruhe. His role in the company has allowed him to further his research and development in rheometry, contributing to advancements in material science and engineering.

Collaborations

Due to space limitations, the details of collaborations will not be included.

Conclusion

Philippe Sierro's innovative work in the field of rheometry exemplifies the importance of precise measurement in material science. His contributions continue to influence the industry and enhance our understanding of material properties.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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