Grenoble, France

Philippe Moenne-Loccoz

This inventor holds 1 USPTO granted patent. Top assignee: Teledyne E2v Semiconductors Sas. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philippe Moenne-Loccoz. Retrieved from https://idiyas.com/inventor/philippe-moenne-loccoz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Philippe Moenne-Loccoz

Introduction

Philippe Moenne-Loccoz is a notable inventor based in Grenoble, France. He has made significant contributions to the field of image capture technology, particularly in addressing challenges posed by cosmic particles.

Latest Patents

One of his key patents is titled "Time delay integration image capture method correcting image defects caused by cosmic particles." This innovative method aims to eliminate image defects produced by high-energy particles passing through a time delay integration image sensor. The technique involves upstream detection on the digital values supplied by the pixels that have observed the same scene point. By calculating the difference between two digital values from pixels that have viewed the same scene, the method can identify and correct corrupted pixel values, ensuring accurate luminance representation of the observed scene.

Career Highlights

Philippe Moenne-Loccoz is currently associated with Teledyne E2v Semiconductors SAS, where he continues to develop advanced imaging technologies. His work has been instrumental in enhancing the reliability and quality of image capture systems.

Collaborations

He collaborates with Pierre Fereyre, contributing to the advancement of imaging solutions and technologies.

Conclusion

Philippe Moenne-Loccoz's innovative work in image capture technology demonstrates his commitment to overcoming challenges in the field. His contributions are vital for improving the accuracy of imaging systems in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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