Soisy-sous-Montmorency, France

Philippe Darbon

This inventor holds 1 USPTO granted patent. Top assignee: Alcatel Fibers Optques. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philippe Darbon. Retrieved from https://idiyas.com/inventor/philippe-darbon-kf8wk3pi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Philippe Darbon: Innovator in Thread Detection Technology

Introduction

Philippe Darbon is a notable inventor based in Soisy-sous-Montmorency, France. He has made significant contributions to the field of technology, particularly in the area of detecting the alignment of dies in relation to threads.

Latest Patents

Philippe holds a patent for a method of detecting whether at least one die is centered about a thread held taut between two fixed points separated by a distance L. This innovative method enhances precision in various applications, showcasing his expertise in engineering and technology.

Career Highlights

Philippe is currently employed at Alcatel Fibers Optiques, where he applies his skills and knowledge to advance fiber optics technology. His work at this esteemed company reflects his commitment to innovation and excellence in the field.

Collaborations

Throughout his career, Philippe has collaborated with talented individuals such as Bernard Floch and Max Matau. These partnerships have contributed to the development of cutting-edge technologies and have fostered a collaborative environment for innovation.

Conclusion

Philippe Darbon is a distinguished inventor whose work in thread detection technology exemplifies his dedication to advancing engineering solutions. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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