Zurich, Switzerland

Philippe Chretien

This inventor holds 1 USPTO granted patent. Top assignee: Zellweger Uster Ag. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philippe Chretien. Retrieved from https://idiyas.com/inventor/philippe-chretien-aq3fxche

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: The Innovations of Philippe Chretien

Introduction

Philippe Chretien is a notable inventor based in Zurich, Switzerland. He has made significant contributions to the field of technology, particularly with his innovative approach to measuring static electricity. His work has garnered attention for its practical applications in various industries.

Latest Patents

Philippe Chretien holds a patent for a static electricity counting meter. This invention is designed to accurately measure static electricity levels, which can be crucial in many manufacturing and electronic processes. His patent showcases his commitment to advancing technology and improving efficiency in relevant fields. He has 1 patent to his name.

Career Highlights

Chretien is currently employed at Zellweger Uster AG, a company known for its expertise in textile technology and measurement solutions. His role at the company allows him to apply his innovative ideas and contribute to the development of cutting-edge technologies. His work at Zellweger Uster AG has positioned him as a key player in the industry.

Conclusion

Philippe Chretien's contributions to the field of technology, particularly through his patent for a static electricity counting meter, highlight his innovative spirit and dedication to advancing industry standards. His work at Zellweger Uster AG further emphasizes his impact on the technological landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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