Chamboeuf, France

Philippe Chapon

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Viavi Solutions Inc.. Active years: 2026.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Philippe Chapon

Introduction

Philippe Chapon is a notable inventor based in Chamboeuf, France. He has made significant contributions to the field of optical technology, particularly with his innovative patent related to optical reflectors. His work exemplifies the intersection of engineering and practical application in modern technology.

Latest Patents

Philippe Chapon holds a patent for a "Fiber element offset length-based optical reflector peak analysis." This invention includes an optical element that is optically connected to a laser source emitting a laser beam. The optical element features a pre-set offset length between multiple adjacent branches. Additionally, the apparatus incorporates an optical time-domain reflectometer (OTDR) that generates an OTDR trace based on optical reflection signals received from corresponding optical reflectors attached to devices under test (DUTs). This innovation qualifies each of the DUTs, showcasing its practical utility in optical analysis.

Career Highlights

Philippe Chapon is associated with Viavi Solutions Inc., a company known for its advanced network and optical solutions. His role at Viavi Solutions has allowed him to contribute to cutting-edge technologies that enhance optical performance and reliability.

Collaborations

Philippe has collaborated with talented coworkers such as Jonathan Setiawan and Patrick Faraj. Their combined expertise fosters an environment of innovation and creativity within their projects.

Conclusion

Philippe Chapon's contributions to optical technology through his patent and work at Viavi Solutions Inc. highlight his role as a significant inventor in the field. His innovative approaches continue to influence advancements in optical analysis and reflectometry.

Profile summary based on public USPTO records.
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