Munich, Germany

Philipp Joppich

This inventor holds 1 USPTO granted patent. Top assignee: Rohde and Schwarz Gmbh & Co. Kg. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philipp Joppich. Retrieved from https://idiyas.com/inventor/philipp-joppich

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Philipp Joppich: Inventor in Hardware-System Maintenance

Introduction

Philipp Joppich is an inventor based in Munich, Germany, associated with Rohde & Schwarz GmbH & Co. KG. His patent work focuses on analyzing hardware-system health and supporting maintenance decisions.

Latest Patents

Joppich is associated with 1 patent: “Maintenance system and method of analyzing and/or creating health information for a hardware system.” The invention describes a maintenance system with acquisition and analysis circuits. The acquisition circuit gathers operational parameters relevant to a hardware system’s health and forwards them for analysis. Using those parameters, the analysis circuit can determine a device health score, estimate remaining useful life, and provide recommendations for operating the system. The patent also describes a method for analyzing or creating health information for hardware systems.

Career Highlights

Joppich’s patent activity reflects an interest in applying operational data to hardware maintenance. The described system connects measured parameters with assessments of equipment condition and potential maintenance guidance.

Collaborations

The supplied information identifies Christian Soldner and Daniel Markert as Joppich’s coworkers. Their names are provided as professional associations, without further details about their roles in the patent.

Conclusion

Philipp Joppich’s patent describes a data-driven approach to assessing hardware health, estimating useful life, and informing system operation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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