Columbus, OH, United States of America

Philip Robert Aldag

This inventor holds 1 USPTO granted patent. Top assignee: Vertiv It Systems, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philip Robert Aldag. Retrieved from https://idiyas.com/inventor/philip-robert-aldag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Philip Robert Aldag: Patent Innovation in Electrical Panel Monitoring.

Introduction

Philip Robert Aldag is an inventor associated with Columbus, Ohio, and Vertiv IT Systems, Inc. His patent work addresses monitoring electrical panels by using temperature data to help identify conditions affecting a breaker or panel.

Latest Patents

Aldag is named on 1 patent: “Systems and Methods for Monitoring Temperature in an Electrical Panel.” The invention describes receiving data from wire and ambient temperature probes connected to a slotted assembly inside an electrical panel. A wire probe senses the temperature of a load wire associated with a breaker, while an ambient probe measures the surrounding temperature. The system uses the data to determine a condition of a breaker or the panel and generates an output indicating that condition.

Career Highlights

Aldag’s listed patent reflects work on electrical monitoring systems designed to provide information about panel and breaker conditions. His company, Vertiv IT Systems, Inc., operates in the technology and infrastructure sector.

Collaborations

Todd Christopher Marchal is identified as Aldag’s coworker. The available information does not specify their roles or describe a particular joint project.

Conclusion

Philip Robert Aldag’s patent focuses on using temperature sensing and data analysis to monitor electrical panels and communicate potential equipment conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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