Horsham, United Kingdom

Philip McGonnell

This inventor holds 1 USPTO granted patent. Top assignee: Transco Plc. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philip McGonnell. Retrieved from https://idiyas.com/inventor/philip-mcgonnell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Biography of Inventor Philip McGonnell

Introduction: Philip McGonnell is a notable inventor based in Horsham, GB, recognized for his innovative contributions to measurement technology. With a focus on developing devices that enhance the accuracy of material thickness measurements, McGonnell has made significant strides in the field.

Latest Patents: McGonnell holds a patent for a "Measurement arrangement," which is a sophisticated measuring device designed to determine the thickness of non-homogeneous mediums, such as road structures. This device utilizes a radar transmitter and two spaced receivers to calculate material thickness while effectively eliminating signal drift.

Career Highlights: Throughout his career, McGonnell has demonstrated a commitment to advancing measurement technology. His work has not only contributed to the field but has also provided practical solutions for various applications in construction and engineering.

Collaborations: McGonnell has collaborated with esteemed colleagues, including Paul Cordes and Peter Ward, at Transco Plc. These partnerships have fostered an environment of innovation and have led to the development of cutting-edge measurement solutions.

Conclusion: Philip McGonnell's contributions to measurement technology exemplify the impact of innovative thinking in addressing real-world challenges. His patent and collaborative efforts continue to influence the industry, showcasing the importance of precision in material assessment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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